Topic：Nanoscale material characterization using Biased Scanning Probe Microscopy (SPM) techniques

Speaker：Prof. Kaiyang Zeng,

　　　　 Department of Mechanical Engineering,National University of Singapore

Time： 9：00~12：00 AM. , Wed., July. 24^th, 2013

Venue：Room 468, Lee Hsun Building, IMR CAS

Welcome to attend！

Abstract:

Over the last two decades, scanning probe microscopy (SPM) has been instrumental in advancing our understanding of materials fundamental phenomena at nano- to micro-scales, such as superconductivity, spin-resolved transport, protein folding, chemical sensing, catalysis, tensorial properties, coupling between electrical field and mechanical stress/strain, resistive switching, properties mapping and many more.

This talk will discuss some of the new developments and applicationsusing biased SPM techniques to characterize various functional properties of materials at nanoscale. The SPM techniques to be discussed include conductive AFM (c-AFM), piezoresponse force microscopy (PFM), electrochemical strain microscopy (ESM), Kelvin probe force microscopy (KPFM), contact resonance force microscopy (CR-FM) as well as multifrequency SPM techniques (band excitation and dual frequency track) etc. The applications of these techniques on Li-ion battery, transition metal oxide thin films and biological systems will be discussed as the examples.